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| ASCII Text | x | ||
| R. David, "Comments on 'Signature Analysis for Multiple Output Circuits' by R. David," IEEE Transactions on Computers, vol. 39, no. 2, pp. 287-288, February, 1990. | |||
| BibTex | x | ||
| @article{ 10.1109/12.45217, author = {R. David}, title = {Comments on 'Signature Analysis for Multiple Output Circuits' by R. David}, journal ={IEEE Transactions on Computers}, volume = {39}, number = {2}, issn = {0018-9340}, year = {1990}, pages = {287-288}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.45217}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Comments on 'Signature Analysis for Multiple Output Circuits' by R. David IS - 2 SN - 0018-9340 SP287 EP288 EPD - 287-288 A1 - R. David, PY - 1990 KW - signature analysis; multiple output circuits; fault-free signature; logic testing. VL - 39 JA - IEEE Transactions on Computers ER - | |||
The probability of a fault-free signature has been calculated in the above-named paper and in an earlier paper by the same author. Implicitly, it was considered as the probability of masking due to signature analysis. It is shown here that this does not correspond exactly to the probability of aliasing. A new definition is given. The difference centers on the event where there are no bit errors in the data to be compressed. When the response of the circuit is correct, the signature is fault-free. However, there is no aliasing.
[1] R. David, "Testing by feedback shift register,"IEEE Trans. Comput., vol. C-29, pp. 668-673, July 1980.
[2] R. David, "Signature analysis for multiple-output circuits,"IEEE Trans. Comput., vol. C-35, pp. 830-837, 1986.
[3] T. W. Williams, W. Daehn, M. Gruetzner, and C. W. Starke, "Comparison of aliasing errors for primitive and non-primitive polynomials," inProc. 1986 Int. Test Conf., Sept. 1986, paper 9.6, pp. 282-288.
[4] T. W. Williams, W. Daehn, M. Gruetzner, and C. W. Starke, "Bounds and analysis of aliasing errors in linear feedback shift registers,"IEEE Design Test, vol. 4, pp. 39-45, April 1987.