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Issue No.02 - February (1990 vol.39)
pp: 220-229
ABSTRACT
<p>It is shown how random testing experiments can be used for fault diagnosis. Starting from a prescribed set of faults, the result of the first experiment allows the authors (1) to determine a subset of faults which are compatible with this result and (2) to choose the second experiment, and so on. An algorithm (each step of which is an experiment) is given, and simulation results are presented.</p>
INDEX TERMS
RAM; fault diagnosis; random testing experiments; simulation results; fault location; random-access storage.
CITATION
R. David, A. Fuentes, "Fault Diagnosis of RAMs from Random Testing Experiments", IEEE Transactions on Computers, vol.39, no. 2, pp. 220-229, February 1990, doi:10.1109/12.45207
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