This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Fault Diagnosis of RAMs from Random Testing Experiments
February 1990 (vol. 39 no. 2)
pp. 220-229

It is shown how random testing experiments can be used for fault diagnosis. Starting from a prescribed set of faults, the result of the first experiment allows the authors (1) to determine a subset of faults which are compatible with this result and (2) to choose the second experiment, and so on. An algorithm (each step of which is an experiment) is given, and simulation results are presented.

[1] S. A. Szygenda and M. J. Flynn, "Failure analysis of memory organization for utilization in a self repair memory system,"IEEE Trans. Reliability, vol. R-20, no. 2, May 1971.
[2] J. P. Hayes, "Detection of pattern sensitive faults in random access memories,"IEEE Trans. Comput., vol. C 24, pp. 150-157, Feb. 1975.
[3] S. M. Thatte, "Fault diagnosis of semi-conductor access memories," Coordinated Sci. Lab., Univ. of Illinois, May 1977.
[4] P. Thevenod-Fosse and R. David, "Test aléatoire de mémoires,"RAIRO Automatique, vol. 12, no. 1, pp. 43-61, 1978.
[5] R. Nair, S. M. Thatte, and J. A. Abraham, "Efficient algorithms for testing semiconductor random access memories,"IEEE Trans. Comput., vol. C-27, pp. 572-576, June 1978.
[6] D. S. Suk and S. M. Reddy, "Test procedures for a class of pattern sensitive faults in semiconductor random access memories,"IEEE Trans. Comput., vol. C-29, pp. 419-429, June 1980.
[7] M. Marinescu, "Simple and efficient algorithms for functional RAM testing," inProc. IEEE Test Conf., Philadelphia, PA, Nov. 1982.
[8] W. H. McAnney, P. H. Bardell, and V. P. Gupta, "Random testing for stuck-at storage cells in an embedded logic," inProc. Int. Test Conf., Philadelphia, PA, Oct. 1984.
[9] C. Papachristou and N. Sahgal, "An improved method for detecting functional faults in semiconductor random access memories,"IEEE Trans. Comput., pp. 110-116, Feb. 1985.
[10] A. Fuentes, R. David, and B. Courtois, "Random testing versus deterministic testing of RAM's," inProc. FTCS16, Vienna, July 1986, pp. 266-271.
[11] A. Fuentes, "Contributionàl'étude du test aléatoire de mémoires RAM," Docteur-Ingénieur Thesis, Institut National Polytechnique de Grenoble, Dec. 1986.
[12] R. David, A. Fuentes and B. Courtois, "Random pattern testing versus deterministic testing of RAM's,"IEEE Trans. Comput., vol. 38, pp. 637-650, May 1989.
[13] J. M. Liu, "Test aléatoire de microprocesseurs: calcul de la longueur de test," student project, Laboratoire d'Automatique de Grenoble, June 1987.

Index Terms:
RAM; fault diagnosis; random testing experiments; simulation results; fault location; random-access storage.
Citation:
R. David, A. Fuentes, "Fault Diagnosis of RAMs from Random Testing Experiments," IEEE Transactions on Computers, vol. 39, no. 2, pp. 220-229, Feb. 1990, doi:10.1109/12.45207
Usage of this product signifies your acceptance of the Terms of Use.