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| M.G. Karpovsky, P. Nagvajara, "Optimal Robust Compression of Test Responses," IEEE Transactions on Computers, vol. 39, no. 1, pp. 138-141, January, 1990. | |||
| BibTex | x | ||
| @article{ 10.1109/12.46290, author = {M.G. Karpovsky and P. Nagvajara}, title = {Optimal Robust Compression of Test Responses}, journal ={IEEE Transactions on Computers}, volume = {39}, number = {1}, issn = {0018-9340}, year = {1990}, pages = {138-141}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.46290}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Optimal Robust Compression of Test Responses IS - 1 SN - 0018-9340 SP138 EP141 EPD - 138-141 A1 - M.G. Karpovsky, A1 - P. Nagvajara, PY - 1990 KW - optimal robust compression; test responses; built-in self-test; VLSI design; statistics; fault-free responses; pseudorandom testing; error detectability; automatic testing; data compression; integrated circuit testing; logic testing; VLSI. VL - 39 JA - IEEE Transactions on Computers ER - | |||
A compression of test responses technique for a built-in self-test (BIST) VLSI design is presented. The authors introduce the notion of a robust compression technique which incorporates prior knowledge of the statistics of fault-free responses under pseudorandom testing to achieve a guaranteed error detectability independent of a distribution of errors. The presented robust quadratic compressor requires two r-bit registers (r-bit signature) more than a multiple-input linear feedback shift register; however, it provides for equal protection against all error patterns. Therefore, quadratic compressors are optimal and robust with respect to a statistics of errors in a device under test.
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