This Article 
 Bibliographic References 
 Add to: 
An Experimental Study of Memory Fault Latency
June 1989 (vol. 38 no. 6)
pp. 869-874
The difficulty with the measurement of fault latency is due to the lack of observability of the fault occurrence and error generation instants in a production environment. The authors describe an experiment, using data from a VAX 11/780 under real workload, to study fault latency in the memory subsystem accurately. Fault latency distributions are generated for stuck-at-zero (s-a-0) and stuck-at

[1] R. Chillarege and R. K. Iyer, "Measurement-based analysis of error latency,"IEEE Trans. Computers, vol. C-36, pp. 529-537, May 1987.
[2] B. Courtois, "Some results about the efficiency of simple," inDig. FTCS-9, 1979.
[3] R. Iyer, D. Rossetti, and M. Hsueh, "Measurement and modeling of computer reliability as affected by system activity,"ACM Trans. Comput. Syst., vol. 4, pp. 214-237, Aug. 1986.
[4] J. H. Lala, "Fault detection, isolation and reconfiguration if FTMP: Methods and experimental results," inFifth Dig. Avionics Syst. Conf., 1983.
[5] J. C. Laprie, "Dependable computing and fault tolerance," inDig., FTCS-15, 1985.
[6] J. G. McGough and F. L. Swern, "Measurement of fault latency in a digital avionic mini processor Part II," NASA Contract. Rep. 3651, Jan. 1983.
[7] J. G. McGough, F. L. Swern, and S. Bavuso, "New results in fault latency modelling," inDig. IEEE EASCON, 1983.
[8] K. G. Shin, private communication, Univ. Michigan, 1987.
[9] K. Shin and Y.-H. Lee, "Measurement and application of fault latency,"IEEE Trans. Computers, vol. C-35, pp. 370-375, Apr. 1986.

Index Terms:
memory fault latency; fault latency; observability; fault occurrence; error generation; VAX 11/780; memory subsystem; fault tolerant computing; storage units; system recovery.
R. Chillarege, R.K. Iyer, "An Experimental Study of Memory Fault Latency," IEEE Transactions on Computers, vol. 38, no. 6, pp. 869-874, June 1989, doi:10.1109/12.24297
Usage of this product signifies your acceptance of the Terms of Use.