Issue No.06 - June (1989 vol.38)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.24297
The difficulty with the measurement of fault latency is due to the lack of observability of the fault occurrence and error generation instants in a production environment. The authors describe an experiment, using data from a VAX 11/780 under real workload, to study fault latency in the memory subsystem accurately. Fault latency distributions are generated for stuck-at-zero (s-a-0) and stuck-at
memory fault latency; fault latency; observability; fault occurrence; error generation; VAX 11/780; memory subsystem; fault tolerant computing; storage units; system recovery.
R. Chillarege, R.K. Iyer, "An Experimental Study of Memory Fault Latency", IEEE Transactions on Computers, vol.38, no. 6, pp. 869-874, June 1989, doi:10.1109/12.24297