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The Complexity of Generating Minimum Test Sets for PLA's and Monotone Combinational Circuits
June 1989 (vol. 38 no. 6)
pp. 865-869
The authors show that the problem of obtaining a minimum complete test set is NP-complete for monotone PLAs even when each product term of the PLA contains at most two literals. Using the ideas developed in the proof of this result, they resolve an open question due to B. Krishnamurthy and S.B. Akers (1984). The authors also show that given a complete test set T, the problem of obtaining a mini

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Index Terms:
complexity; minimum test sets; monotone combinational circuits; minimum complete test set; monotone PLAs; literals; NP-complete; combinatorial circuits; computational complexity; logic arrays; logic testing.
Citation:
S. Chakravarty, H.B. Hunt, III, S.S. Ravi, D.J. Rosenkrantz, "The Complexity of Generating Minimum Test Sets for PLA's and Monotone Combinational Circuits," IEEE Transactions on Computers, vol. 38, no. 6, pp. 865-869, June 1989, doi:10.1109/12.24296
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