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Random Pattern Testing Versus Deterministic Testing of RAMs
May 1989 (vol. 38 no. 5)
pp. 637-650
The number of (random) patterns required for random testing of RAMs (random-access memories), when classical fault models including pattern-sensitive faults are considered is determined. Markov chains are a powerful tool for this purpose. Single faults are considered first, and the influence of different parameters is analyzed. Double faults are then considered and arguments are presented to ex

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Index Terms:
random pattern testing; single faults; double faults; deterministic testing; RAMs; random-access memories; classical fault models; pattern-sensitive faults; Markov chains; parameters; multiple-coupling faults; test patterns; integrated circuit testing; Markov processes; random-access storage.
Citation:
R. David, A. Fuentes, B. Courtois, "Random Pattern Testing Versus Deterministic Testing of RAMs," IEEE Transactions on Computers, vol. 38, no. 5, pp. 637-650, May 1989, doi:10.1109/12.24267
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