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| I. Koren, C.H. Stapper, "Introduction Special Section on High-Yield Systems," IEEE Transactions on Computers, vol. 38, no. 4, pp. 481-483, April, 1989. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1989.10002, author = {I. Koren and C.H. Stapper}, title = {Introduction Special Section on High-Yield Systems}, journal ={IEEE Transactions on Computers}, volume = {38}, number = {4}, issn = {0018-9340}, year = {1989}, pages = {481-483}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1989.10002}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Introduction Special Section on High-Yield Systems IS - 4 SN - 0018-9340 SP481 EP483 EPD - 481-483 A1 - I. Koren, A1 - C.H. Stapper, PY - 1989 VL - 38 JA - IEEE Transactions on Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.1989.10002
[1] Proc. Int. Workshop Designing For Yield, Oxford, England, July 1- 3, 1987, Also inYield Modelling and Defect Tolerance in VLSI, W. R. Moore, W. Maly, and A. Strojwas, Eds. London, England, Hilger, 1988.
[2] Proc. IEEE Int. Workshop Defect and Fault Tolerance in VLSI Systems, Springfield, Oct. 6-7, 1988, New York: Plenum, 1989.
Citation:
I. Koren, C.H. Stapper, "Introduction Special Section on High-Yield Systems," IEEE Transactions on Computers, vol. 38, no. 4, pp. 481-483, April 1989, doi:10.1109/TC.1989.10002
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