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Introduction Special Section on High-Yield Systems
April 1989 (vol. 38 no. 4)
pp. 481-483

[1] Proc. Int. Workshop Designing For Yield, Oxford, England, July 1- 3, 1987, Also inYield Modelling and Defect Tolerance in VLSI, W. R. Moore, W. Maly, and A. Strojwas, Eds. London, England, Hilger, 1988.
[2] Proc. IEEE Int. Workshop Defect and Fault Tolerance in VLSI Systems, Springfield, Oct. 6-7, 1988, New York: Plenum, 1989.

Citation:
I. Koren, C.H. Stapper, "Introduction Special Section on High-Yield Systems," IEEE Transactions on Computers, vol. 38, no. 4, pp. 481-483, April 1989, doi:10.1109/TC.1989.10002
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