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Issue No.10 - October (1988 vol.37)
pp: 1288-1293
ABSTRACT
A method is presented for functional testing of microprocessors. First, a control fault model at the RTL (register transfer language) level is developed. Based on this model, the authors establish testing requirements for control faults. They present two test procedures to verify the write and read sequences, and use the write and read sequences to test each instruction in the microprocessor. B
INDEX TERMS
functional testing method; microprocessors; control fault model; register transfer language; testing requirements; k-out-of-m codes; test generation time; computer testing; microprocessor chips.
CITATION
L. Shen, S.Y.H. Su, "A Functional Testing Method for Microprocessors", IEEE Transactions on Computers, vol.37, no. 10, pp. 1288-1293, October 1988, doi:10.1109/12.5992
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