This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
A Functional Testing Method for Microprocessors
October 1988 (vol. 37 no. 10)
pp. 1288-1293
A method is presented for functional testing of microprocessors. First, a control fault model at the RTL (register transfer language) level is developed. Based on this model, the authors establish testing requirements for control faults. They present two test procedures to verify the write and read sequences, and use the write and read sequences to test each instruction in the microprocessor. B

[1] A. C. L. Chiang and R. McCaskill, "Two new approaches simplify testing of microprocessors,"Electron., vol. 22, p. 100, Jan. 1976.
[2] S. M. Thatte and J. A. Abraham, "Methodology for functional level testing of microprocessors," inProc. 8th Int. Symp. Fault-Tolerant Comput., Toulouse, France, June 1978, pp. 90-95.
[3] S. M. Thatte and J. A. Abraham, "Testing generation for microprocessors,"IEEE Trans. Comput., vol. C-29, pp. 429-441, June 1980.
[4] J. A. Abraham and S. M. Thatte, "Fault coverage of testing program for a microprocessor," inProc. 1979 Test Conf., Oct. 1979, pp. 18- 22.
[5] J. A. Abraham and K. P. Parker, "Practical microprocessor testing: Open and closed loop approaches," inProc. IEEE COMPCON, Spring 1981, pp. 308-311.
[6] Y. Min and S. Y. H. Su, "Testing functional faults in VLSI," inProc. 19th Design Automat. Conf., Las Vegas, NV, 1982, pp. 384-392.
[7] K. K. Saluja, L. Shen, and S. Y. H. Su, "A simplified algorithm for testing microprocessors," inProc. 1983 Test Conf., Oct. 1983, pp. 668-675.
[8] D. Brahme and J. A. Abraham, "Functional testing of microprocessors,"IEEE Trans. Comput., vol. C-33, pp. 475-485, June 1984.
[9] C. Robach and G. Saucier, "Microprocessor functional testing," inProc. 1980 Test Conf., Nov. 1980, pp. 433-443.
[10] M. A. Annaratone and M. G. Sami, "An approach to functional testing of microprocessors," inProc. 12th Int. Symp. Fault-Tolerant Comput., Santa Monica, CA, June 1982, pp. 158-164.
[11] B. Courtois, "Functional testing of the control section of integrated processing units," RR 203, IMAC, Univ. Grenoble, France, May 1980.
[12] L. Shen and S. Y. H. Su, "A functional testing method for microprocessors," Res. Rep. 83-1, Research Group on Design Automation and Fault-Tolerant-Computing, T. J. Watson School of Engineering, SUNY--Binghamton, Nov. 1983.
[13] L. Shen, "Functional testing for control faults of microprocessors,"Chinese J. Comput. Res. Develop., vol. 24, July 1987.
[14] P. Lala,Fault-tolerant and fault testable hardware design. Englewood Cliffs, NJ, Prentice-Hall, 1985.

Index Terms:
functional testing method; microprocessors; control fault model; register transfer language; testing requirements; k-out-of-m codes; test generation time; computer testing; microprocessor chips.
Citation:
L. Shen, S.Y.H. Su, "A Functional Testing Method for Microprocessors," IEEE Transactions on Computers, vol. 37, no. 10, pp. 1288-1293, Oct. 1988, doi:10.1109/12.5992
Usage of this product signifies your acceptance of the Terms of Use.