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Built-In Checking of the Correct Self-Test Signature
September 1988 (vol. 37 no. 9)
pp. 1142-1145
A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, e.g. all zeros. In this way, it is possible to determine if a fault has been detected by ORing the outputs of the register stages. Since the OR operation can be built-in, a single

[1] B. Koenemann, J. Mucha, and G. Ziehoff, "Built-in test for complex digital integrated circuits,"IEEE J. Solid State Circuits, vol. SC-15, pp. 315-319, 1980.
[2] M. T. M. Segers, "A self-test method for digital circuits," inProc. 1981 Int. Test Conf., Philadelphia, PA, Oct. 1981, pp. 79-81.
[3] R. David, "Testing by feedback shift register,"IEEE Trans. Comput., vol. C-29, pp. 668-673, July 1980.
[4] D. K. Bhavsar and R. W. Heckelman, "Self-testing by polynomial division," inProc. 1981 Int. Test Conf., Philadelphia, PA, Oct. 1981, pp. 208-216.

Index Terms:
self-test signature; initial value; signature register; built-in testing; single observation; automatic testing; logic testing.
Citation:
W.H. McAnney, J. Savir, "Built-In Checking of the Correct Self-Test Signature," IEEE Transactions on Computers, vol. 37, no. 9, pp. 1142-1145, Sept. 1988, doi:10.1109/12.2268
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