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Strongly Fault Secure PLAs and Totally Self-Checking Checkers
July 1988 (vol. 37 no. 7)
pp. 863-867
ASCII Text
x 
 
Y. Min, J. Li, "Strongly Fault Secure PLAs and Totally Self-Checking Checkers," IEEE Transactions on Computers, vol. 37, no. 7, pp. 863-867, July, 1988.
 
 
BibTex
x
 
@article{ 10.1109/12.2233,
author = {Y. Min and J. Li},
title = {Strongly Fault Secure PLAs and Totally Self-Checking Checkers},
journal ={IEEE Transactions on Computers},
volume = {37},
number = {7},
issn = {0018-9340},
year = {1988},
pages = {863-867},
doi = {http://doi.ieeecomputersociety.org/10.1109/12.2233},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - Strongly Fault Secure PLAs and Totally Self-Checking Checkers
IS - 7
SN - 0018-9340
SP863
EP867
EPD - 863-867
A1 - Y. Min,
A1 - J. Li,
PY - 1988
KW - strongly fault secure PLAs; totally self-checking checkers; programmable logic arrays; two-rail code; XOB parity checker tree; comparator; cellular arrays; comparators (circuits); logic testing.
VL - 37
JA - IEEE Transactions on Computers
ER -
 
A general approach is presented to the design of totally self-checking (TSC) programmable logic arrays (PLAs). A strongly fault secure (SFS) implementation is suggested for the functional PLA, which is shown to be SFS whenever the output is encoded by two-rail code. K-unit TSC checker (TSCC) element are defined to construct TSC checkers. The TSCC is very appropriate for the companion of the SLF

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[10] J. A. Hughes, E. J. McCluskey, and D. Lu, "Design of totally self-checking comparators with an arbitrary number of inputs,"IEEE Trans. Comput., vol. C-33, no. 6, 1984.
[11] Y. Min and Z. Li, "A unified fault model for PLAs," inProc. Int. Conf. Circuits Syst., Beijing, China, 1985.
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Index Terms:
strongly fault secure PLAs; totally self-checking checkers; programmable logic arrays; two-rail code; XOB parity checker tree; comparator; cellular arrays; comparators (circuits); logic testing.
Citation:
Y. Min, J. Li, "Strongly Fault Secure PLAs and Totally Self-Checking Checkers," IEEE Transactions on Computers, vol. 37, no. 7, pp. 863-867, July 1988, doi:10.1109/12.2233
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