This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Functional Test Generation Based on Unate Function Theory
June 1988 (vol. 37 no. 6)
pp. 756-760
The generation of a universal test set (UTS) for unate functions is used as a starting point. This test set is complete and minimal for the set of all unateness-preserving faults. However, for functions that are not unate in any variable, the UTS generated by this algorithm is the exhaustive set. An algorithm is presented that computes a good functional test set (GFTS) of reasonable size even f

[1] R. Betancourt, "Derivation of minimum test sets for unate logical circuits,"IEEE Trans. Comput., vol. C-20, pp. 1264-1269, Nov. 1971.
[2] S. B. Akers, "Universal test sets for logic networks," inProc. 13th Annu. Switching Automata Theory Symp., Oct. 1972, pp. 177-184.
[3] S. M. Reddy, "Complete test sets for logic functions,"IEEE Trans. Comput., vol. C-22, pp. 1016-1020, Nov. 1973.
[4] R. Brayton, G. Hachtel, C. McMullen, and A. Sangio-Vincentelli,Logic Minimization Algorithms for VLSI Synthesis. Boston, MA: Kluwer Academic, 1984.
[5] R. McNaughton, "Unate truth functions,"IRE Trans. Electron. Comput., vol. EC-10, pp. 1-6, Mar. 1961.

Index Terms:
functional test generation; unate function theory; unateness-preserving faults; good functional test set; random test sets; gate-level fault coverage; logic testing.
Citation:
V. Pitchumani, S.S. Soman, "Functional Test Generation Based on Unate Function Theory," IEEE Transactions on Computers, vol. 37, no. 6, pp. 756-760, June 1988, doi:10.1109/12.2218
Usage of this product signifies your acceptance of the Terms of Use.