Issue No.06 - June (1988 vol.37)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.2218
The generation of a universal test set (UTS) for unate functions is used as a starting point. This test set is complete and minimal for the set of all unateness-preserving faults. However, for functions that are not unate in any variable, the UTS generated by this algorithm is the exhaustive set. An algorithm is presented that computes a good functional test set (GFTS) of reasonable size even f
functional test generation; unate function theory; unateness-preserving faults; good functional test set; random test sets; gate-level fault coverage; logic testing.
V. Pitchumani, "Functional Test Generation Based on Unate Function Theory", IEEE Transactions on Computers, vol.37, no. 6, pp. 756-760, June 1988, doi:10.1109/12.2218