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A Fault-Tolerant Systolic Sorter
May 1988 (vol. 37 no. 5)
pp. 621-624
ASCII Text
x 
 
Y.-H. Choi, M. Malek, "A Fault-Tolerant Systolic Sorter," IEEE Transactions on Computers, vol. 37, no. 5, pp. 621-624, May, 1988.
 
 
BibTex
x
 
@article{ 10.1109/12.4615,
author = {Y.-H. Choi and M. Malek},
title = {A Fault-Tolerant Systolic Sorter},
journal ={IEEE Transactions on Computers},
volume = {37},
number = {5},
issn = {0018-9340},
year = {1988},
pages = {621-624},
doi = {http://doi.ieeecomputersociety.org/10.1109/12.4615},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - A Fault-Tolerant Systolic Sorter
IS - 5
SN - 0018-9340
SP621
EP624
EPD - 621-624
A1 - Y.-H. Choi,
A1 - M. Malek,
PY - 1988
KW - reconfiguration; VLSI sorter; fault-tolerant systolic sorter; algorithm-based fault tolerance; testing; invariants; permanent computation errors; error-checking code; redundant cells; single faulty cell; hardware overhead; time overhead; offline fault-testing; permanent stuck-at faults; automatic testing; cellular arrays; digital integrated circuits; error detection codes; fault tolerant computing; integrated circuit testing; redundancy; sorting.
VL - 37
JA - IEEE Transactions on Computers
ER -
 
A fault-tolerant systolic sorter design is proposed. An algorithm-based fault tolerance is achieved by testing the invariants of a systolic sorter during normal operation. Transient and permanent computation errors can be detected by using error-checking code and some redundant cells. A block with a single faulty cell can be located. Small hardware overhead and negligible time overhead are show

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Index Terms:
reconfiguration; VLSI sorter; fault-tolerant systolic sorter; algorithm-based fault tolerance; testing; invariants; permanent computation errors; error-checking code; redundant cells; single faulty cell; hardware overhead; time overhead; offline fault-testing; permanent stuck-at faults; automatic testing; cellular arrays; digital integrated circuits; error detection codes; fault tolerant computing; integrated circuit testing; redundancy; sorting.
Citation:
Y.-H. Choi, M. Malek, "A Fault-Tolerant Systolic Sorter," IEEE Transactions on Computers, vol. 37, no. 5, pp. 621-624, May 1988, doi:10.1109/12.4615
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