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On the Design of Pseudoexhaustive Testable PLAs
April 1988 (vol. 37 no. 4)
pp. 468-472
A method is presented to design pseudoexhaustive testable (PET) PLAs (programmable logic arrays) that are suitable for BIST (built-in self-test) environments. The key idea of the design is to partition inputs and product lines into groups. During testing, a group of inputs and a group of product lines are selected and tested exhaustively. The proposed design leads to small test sizes and relati

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Index Terms:
pseudoexhaustive testable PLA; design; programmable logic arrays; built-in self-test; cellular arrays; logic design; logic testing.
Citation:
Dong Sam Ha, S.M. Reddy, "On the Design of Pseudoexhaustive Testable PLAs," IEEE Transactions on Computers, vol. 37, no. 4, pp. 468-472, April 1988, doi:10.1109/12.2193
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