Issue No.04 - April (1988 vol.37)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.2186
It is shown that a test set based on two-pattern tests, which are designed to detect single stuck-open faults, can be found that detects all multiple stuck-open faults inside any CMOS gate in the circuit. The concept is extended to three-pattern tests, which are obtained for every single stuck-open fault at the checkpoints. If a certain condition is satisfied, then it can be shown that the resu
multiple stuck-open fault detection; CMOS logic circuits; two-pattern tests; CMOS integrated circuits; integrated logic circuits; logic circuits; logic testing.
N.K. Jha, "Multiple Stuck-Open Fault Detection in CMOS Logic Circuits", IEEE Transactions on Computers, vol.37, no. 4, pp. 426-432, April 1988, doi:10.1109/12.2186