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Optimal Design and Sequential Analysis of VLSI Testing Strategy
March 1988 (vol. 37 no. 3)
pp. 339-347
A method for determining the optimal testing period and measuring the production yield is discussed. With the increased complexity of VLSI circuits, testing has become more costly and time-consuming. The design of a testing strategy, which is specified by the testing period based on the coverage function of the testing algorithm, involves trading off the cost of testing and the penalty of passi

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Index Terms:
optimal design; sequential analysis; VLSI testing strategy; production yield; coverage function; fault tolerant computing; integrated circuit testing; VLSI.
Citation:
P.S. Yu, C.M. Krishna, Y.-H. Lee, "Optimal Design and Sequential Analysis of VLSI Testing Strategy," IEEE Transactions on Computers, vol. 37, no. 3, pp. 339-347, March 1988, doi:10.1109/12.2171
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