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Issue No.03 - March (1988 vol.37)
pp: 339-347
ABSTRACT
A method for determining the optimal testing period and measuring the production yield is discussed. With the increased complexity of VLSI circuits, testing has become more costly and time-consuming. The design of a testing strategy, which is specified by the testing period based on the coverage function of the testing algorithm, involves trading off the cost of testing and the penalty of passi
INDEX TERMS
optimal design; sequential analysis; VLSI testing strategy; production yield; coverage function; fault tolerant computing; integrated circuit testing; VLSI.
CITATION
P.S. Yu, C.M. Krishna, Y.-H. Lee, "Optimal Design and Sequential Analysis of VLSI Testing Strategy", IEEE Transactions on Computers, vol.37, no. 3, pp. 339-347, March 1988, doi:10.1109/12.2171
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