Issue No.02 - February (1988 vol.37)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.2155
A cost-effective method is presented for the deductive simulation of fault effects propagating through sequential functional modules that are described by the state-diagram representation of a Moore or Mealy automaton. The cornerstone of the method is a novel definition of the internal fault list of a sequential module. The method can be particularly useful for sequential modules when the state
deductive fault simulation; Moore automaton; sequential functional modules; state-diagram representation; Mealy automaton; internal fault list; failure analysis; finite automata; logic testing; sequential circuits; state-space methods.
K. Walczak, "Deductive Fault Simulation for Sequential Module Circuits", IEEE Transactions on Computers, vol.37, no. 2, pp. 237-239, February 1988, doi:10.1109/12.2155