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Deductive Fault Simulation for Sequential Module Circuits
February 1988 (vol. 37 no. 2)
pp. 237-239
A cost-effective method is presented for the deductive simulation of fault effects propagating through sequential functional modules that are described by the state-diagram representation of a Moore or Mealy automaton. The cornerstone of the method is a novel definition of the internal fault list of a sequential module. The method can be particularly useful for sequential modules when the state

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[2] P. R. Menon and S. G. Chappell, "Deductive fault simulation with functional block,"IEEE Trans. Comput., vol. C-27, pp. 689-695, Aug. 1978.
[3] K. Sapiecha and K. Walczak, "Deductive fault simulation from functional description of logic circuits," inProc. V Conf. FTSD, Katowice, 1982, pp. 67-74.

Index Terms:
deductive fault simulation; Moore automaton; sequential functional modules; state-diagram representation; Mealy automaton; internal fault list; failure analysis; finite automata; logic testing; sequential circuits; state-space methods.
Citation:
K. Walczak, "Deductive Fault Simulation for Sequential Module Circuits," IEEE Transactions on Computers, vol. 37, no. 2, pp. 237-239, Feb. 1988, doi:10.1109/12.2155
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