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The Reliability of Single-Error Protected Computer Memories
January 1988 (vol. 37 no. 1)
pp. 114-119
The lifetimes of computer memories which are protected with single-error-correcting-double-error-detecting (SEC-DED) codes are studies. The authors assume that there are five possible types of memory chip failure (single-cell, row, column, row-column and whole chip), and, after making a simplifying assumption (the Poisson assumption), have substantiated that experimentally. A simple closed-form

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Index Terms:
single-error correcting double-error detecting codes; SEC-DED codes; reliability; single-error protected computer memories; lifetimes; memory chip failure; Poisson assumption; closed-form expression; mean time to failure; circuit reliability; error correction codes; error detection codes; life testing; semiconductor storage; statistical analysis.
Citation:
M. Blaum, R. Goodman, R. McEliece, "The Reliability of Single-Error Protected Computer Memories," IEEE Transactions on Computers, vol. 37, no. 1, pp. 114-119, Jan. 1988, doi:10.1109/12.75143
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