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Issue No.01 - January (1988 vol.37)
pp: 88-110
ABSTRACT
A novel methodology for investigating wafer-scale integration (WSI) designs is proposed. This methodology combines the results of work on integrated circuit yield modeling with a study of the effects of system architecture in large-area integrated circuit yield. This work provides a hierarchical framework in which computing structures may be analyzed to determine functionality on a wafer scale
INDEX TERMS
architectural yield optimisation; wafer-scale integration; integrated circuit yield modeling; computing structures; circuit reliability; computer architecture; failure analysis; fault tolerant computing; redundancy; VLSI.
CITATION
J.C. Harden, N.R. Stader, II, "Architectural Yield Optimization for WSI", IEEE Transactions on Computers, vol.37, no. 1, pp. 88-110, January 1988, doi:10.1109/12.75138
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