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Fault Propagation Through Embedded Multiport Memories
May 1987 (vol. 36 no. 5)
pp. 592-602
J. Savir, Data Systems Division, IBM Corporation
An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.
Index Terms:
self-testing, Detection probability, embedded memory, fault detection, logic testing, Markov chain, random access memory, random patterns
Citation:
J. Savir, W.H. McAnney, S.R. Vecchio, "Fault Propagation Through Embedded Multiport Memories," IEEE Transactions on Computers, vol. 36, no. 5, pp. 592-602, May 1987, doi:10.1109/TC.1987.1676944
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