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Issue No.05 - May (1987 vol.36)
pp: 592-602
ABSTRACT
An analytical method is described for determining the random pattern testability of permanent faults in the prelogic driving the data-in and the address lines of a multiport random access memory whose outputs are directly observable. The results can be used with minimal extensions to existing detection probability tools such as the cutting algorithm.
INDEX TERMS
self-testing, Detection probability, embedded memory, fault detection, logic testing, Markov chain, random access memory, random patterns
CITATION
W.H. McAnney, S.R. Vecchio, "Fault Propagation Through Embedded Multiport Memories", IEEE Transactions on Computers, vol.36, no. 5, pp. 592-602, May 1987, doi:10.1109/TC.1987.1676944
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