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Issue No.02 - February (1987 vol.36)
pp: 252-256
C.K. Chin , Center for Reliable Computing, Departments of Electrical Engineering and Computer Science, Stanford University
ABSTRACT
The process of determining the required test length for a desired level of confidence for pseudorandom testing using a random sampling without replacement model is examined. The differences between random and pseudorandom testing are discussed and developed. The strictly random testing model is shown to be inaccurate for high confidence testing of combinational circuits. A method of calculating the required test length for pseudorandom testing based upon fault detectabilities is described. The result provides a very accurate prediction of required test length applicable to self-test using pseudorandom inputs.
INDEX TERMS
random testing, Built-in self-test, combinational circuits, linear feedback shift register (LFSR), pseudorandom testing
CITATION
C.K. Chin, "Test Length for Pseudorandom Testing", IEEE Transactions on Computers, vol.36, no. 2, pp. 252-256, February 1987, doi:10.1109/TC.1987.1676892
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