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Linear Dependencies in Linear Feedback Shift Registers
December 1986 (vol. 35 no. 12)
pp. 1086-1088
C.L. Chen, IBM
Linear feedback shift registers have been proposed to generate test patterns for the self-test of logic networks. The probability of linear dependence among k bit positions of a subset of k bits in a maximum length shift register sequence is an outstanding problem. In this correspondence, we derive a formula for the calculation of the probability.
Index Terms:
test pattern generation, Linear feedback shift registers, self-test
Citation:
C.L. Chen, "Linear Dependencies in Linear Feedback Shift Registers," IEEE Transactions on Computers, vol. 35, no. 12, pp. 1086-1088, Dec. 1986, doi:10.1109/TC.1986.1676718
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