The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.12 - December (1986 vol.35)
pp: 1086-1088
C.L. Chen , IBM
ABSTRACT
Linear feedback shift registers have been proposed to generate test patterns for the self-test of logic networks. The probability of linear dependence among k bit positions of a subset of k bits in a maximum length shift register sequence is an outstanding problem. In this correspondence, we derive a formula for the calculation of the probability.
INDEX TERMS
test pattern generation, Linear feedback shift registers, self-test
CITATION
C.L. Chen, "Linear Dependencies in Linear Feedback Shift Registers", IEEE Transactions on Computers, vol.35, no. 12, pp. 1086-1088, December 1986, doi:10.1109/TC.1986.1676718
21 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool