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Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits
December 1986 (vol. 35 no. 12)
pp. 1068-1071
null Chuen-Liang Chen, Department of Computer Science and Information Engineering, National Taiwan University
In this correspondence, we present procedures for constructing universal fault detection test sets as well as fault location test sets for multivalued linear circuits, under a multiple stuck-fault model. The bin packing problem is involved in the procedures. The sizes of the fault detection test set and the fault location test set constructed for an n- variable v-valued linear tree circuit are 1 + ?n/(v - 1)? and 1 + ?n/ ?log2 v? ?, respectively. It has been proved that the sizes listed above are optimal for some cases.
Index Terms:
universal test set, Bin packing problem, linear circuit, multivalued logic, stuck-fault detection/location
Citation:
null Chuen-Liang Chen, null Min-Wen Du, "Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits," IEEE Transactions on Computers, vol. 35, no. 12, pp. 1068-1071, Dec. 1986, doi:10.1109/TC.1986.1676714
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