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October 1986 (vol. 35 no. 10)
pp. 862-870
| ASCII Text | x | ||
| K. Kinoshita, K.K. Saluja, "Built-In Testing of Memory Using an On-Chip Compact Testing Scheme," IEEE Transactions on Computers, vol. 35, no. 10, pp. 862-870, October, 1986. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1986.1676677, author = {K. Kinoshita and K.K. Saluja}, title = {Built-In Testing of Memory Using an On-Chip Compact Testing Scheme}, journal ={IEEE Transactions on Computers}, volume = {35}, number = {10}, issn = {0018-9340}, year = {1986}, pages = {862-870}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1986.1676677}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Built-In Testing of Memory Using an On-Chip Compact Testing Scheme IS - 10 SN - 0018-9340 SP862 EP870 EPD - 862-870 A1 - K. Kinoshita, A1 - K.K. Saluja, PY - 1986 KW - weight-sensitive faults KW - Built-in self-testing (BIST) KW - built-in testing (BIT) KW - hardware complexity KW - pattern-sensitive faults KW - random- access memory (RAM) KW - stuck-at faults VL - 35 JA - IEEE Transactions on Computers ER - | |||
In this paper we study the problem of testing RAM. A new fault model, which encompasses the existing fault models, is proposed. We then propose a scheme of testing faults from the new fault model using built-in testing techniques. We introduce concept of p-hard and determine the complexity of the extra hardware required for built-in self-testing on our hardness scale. A novel approach using microcoded ROM for implementation of built-in testing is also proposed and its complexity is determined.
Index Terms:
weight-sensitive faults, Built-in self-testing (BIST), built-in testing (BIT), hardware complexity, pattern-sensitive faults, random- access memory (RAM), stuck-at faults
Citation:
K. Kinoshita, K.K. Saluja, "Built-In Testing of Memory Using an On-Chip Compact Testing Scheme," IEEE Transactions on Computers, vol. 35, no. 10, pp. 862-870, Oct. 1986, doi:10.1109/TC.1986.1676677
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