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| R. David, "Signature Analysis for Multiple-Output Circuits," IEEE Transactions on Computers, vol. 35, no. 9, pp. 830-837, September, 1986. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1986.1676843, author = {R. David}, title = {Signature Analysis for Multiple-Output Circuits}, journal ={IEEE Transactions on Computers}, volume = {35}, number = {9}, issn = {0018-9340}, year = {1986}, pages = {830-837}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1986.1676843}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Signature Analysis for Multiple-Output Circuits IS - 9 SN - 0018-9340 SP830 EP837 EPD - 830-837 A1 - R. David, PY - 1986 KW - signature analysis KW - Correlated errors KW - error models KW - multioutput circuits VL - 35 JA - IEEE Transactions on Computers ER - | |||
A scheme of a good signature analysis by a linear feedback shift register (LFSR) is presented. It works for k-output circuits, even if k is greater than the register length. It is built according to rules which are presented in the correspondence, taking into account error models which are introduced. The rules are derived from a property which is formally shown for one kind of LFSR. However, some of them apply to other LFSR schemes too.
Index Terms:
signature analysis, Correlated errors, error models, multioutput circuits
Citation:
R. David, "Signature Analysis for Multiple-Output Circuits," IEEE Transactions on Computers, vol. 35, no. 9, pp. 830-837, Sept. 1986, doi:10.1109/TC.1986.1676843
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