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Issue No.04 - April (1986 vol.35)
pp: 375-379
M.S. Abadir , Department of Electrical Engineering?Systems, University of Southern California
ABSTRACT
This correspondence presents a test generation methodology for VLSI circuits described at the functional level. A VLSI circuit is modeled as a network of functional modules such as registers, adders, RAM's, and MUX's. The functions of the individual modules are described using binary decision diagrams. A functional fault model is developed independent of the implementation details of the circuit. A generalized D algorithm is proposed for generating tests to detect functional as well as gate-level faults. Algorithms which perform fault excitation, implication, D propagation, and line justification on the functional modules are also described.
INDEX TERMS
functional test generation, Binary decision diagrams, D algorithm, fault model, fault detection, functional faults
CITATION
M.S. Abadir, "Functional Test Generation for Digital Circuits Described Using Binary Decision Diagrams", IEEE Transactions on Computers, vol.35, no. 4, pp. 375-379, April 1986, doi:10.1109/TC.1986.1676774
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