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| ASCII Text | x | ||
| K.G. Shin, null Yann-Hang Lee, "Measurement and Application of Fault Latency," IEEE Transactions on Computers, vol. 35, no. 4, pp. 370-375, April, 1986. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1986.1676773, author = {K.G. Shin and null Yann-Hang Lee}, title = {Measurement and Application of Fault Latency}, journal ={IEEE Transactions on Computers}, volume = {35}, number = {4}, issn = {0018-9340}, year = {1986}, pages = {370-375}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1986.1676773}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Measurement and Application of Fault Latency IS - 4 SN - 0018-9340 SP370 EP375 EPD - 370-375 A1 - K.G. Shin, A1 - null Yann-Hang Lee, PY - 1986 KW - maximum likelihood estimator KW - Detection time KW - fault and error latency KW - fault injection KW - hazard rate VL - 35 JA - IEEE Transactions on Computers ER - | |||
The time interval between the occurrence of a fault and the detection of the error caused by the fault is divided by the generation of that error into two parts: fault latency and error latency. Since the moment of error generation is not directly observable, all related works in the literature have dealt with only the sum of fault and error latencies, thereby making the analysis of their separate effects impossible. To remedy this deficiency, we 1) present a new methodology for indirectly measuring fault latency, 2) derive the distribution of fault latency from the methodology, and 3) apply the knowledge of fault latency to the analysis of two important examples.
Index Terms:
maximum likelihood estimator, Detection time, fault and error latency, fault injection, hazard rate
Citation:
K.G. Shin, null Yann-Hang Lee, "Measurement and Application of Fault Latency," IEEE Transactions on Computers, vol. 35, no. 4, pp. 370-375, April 1986, doi:10.1109/TC.1986.1676773
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