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null Laung-Terng Wang, Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
This paper presents a design technique for linear feedback shift registers that generate test patterns for pseudoexhaustive testing. This technique is applicable to any combinational network in which none of the outputs depends on all inputs. It does not rewire the original network inputs during in-circuit test pattern generation. Thus, the possibility of undetected faults on some inputs is eliminated.
Index Terms:
test pattern generation, Autonomous test, built-in self-test, condensed LFSR testing, LFSR testing, pseudoexhaustive testing
Citation:
null Laung-Terng Wang, E.J. McCluskey, "Condensed Linear Feedback Shift Register (LFSR) Testing?A Pseudoexhaustive Test Technique," IEEE Transactions on Computers, vol. 35, no. 4, pp. 367-370, April 1986, doi:10.1109/TC.1986.1676772
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