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Testability Conditions for Bilateral Arrays of Combinational Cells
January 1986 (vol. 35 no. 1)
pp. 13-22
| ASCII Text | x | ||
| A. Vergis, K. Steiglitz, "Testability Conditions for Bilateral Arrays of Combinational Cells," IEEE Transactions on Computers, vol. 35, no. 1, pp. 13-22, January, 1986. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1986.1676653, author = {A. Vergis and K. Steiglitz}, title = {Testability Conditions for Bilateral Arrays of Combinational Cells}, journal ={IEEE Transactions on Computers}, volume = {35}, number = {1}, issn = {0018-9340}, year = {1986}, pages = {13-22}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1986.1676653}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Testability Conditions for Bilateral Arrays of Combinational Cells IS - 1 SN - 0018-9340 SP13 EP22 EPD - 13-22 A1 - A. Vergis, A1 - K. Steiglitz, PY - 1986 KW - testability conditions KW - Bilateral arrays KW - combinational cells KW - fault detection KW - linear growth KW - one-step testability KW - preset test sequences KW - quadratic growth KW - systolic array VL - 35 JA - IEEE Transactions on Computers ER - | |||
Two sets of conditions are derived that make one- dimensional bilateral arrays of combinational cells testable for single faulty cells. The test sequences are preset and, in the worst case, grow quadratically with the size of the array. Conditions for testability in linear time are also derived. The basic cell can operate at the bit or at the word level. An implementation of FIR filters using (systolic) one-dimensional bilateral arrays of cells, which can be considered combinational at the word level, is presented as an example. A straightforward generalization for the two- dimensional case is made; a systolic array used for matrix multiplication is presented as an example for this case.
Index Terms:
testability conditions, Bilateral arrays, combinational cells, fault detection, linear growth, one-step testability, preset test sequences, quadratic growth, systolic array
Citation:
A. Vergis, K. Steiglitz, "Testability Conditions for Bilateral Arrays of Combinational Cells," IEEE Transactions on Computers, vol. 35, no. 1, pp. 13-22, Jan. 1986, doi:10.1109/TC.1986.1676653
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