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Issue No.07 - July (1985 vol.34)
pp: 680
ABSTRACT
In the above paper,1 the authors' photographs were inadvertently switched. The biographies and photographs should have appeared as follows.
INDEX TERMS
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CITATION
"Correction to "Modeling and Test Generation Algorithms for MOS Circuits"", IEEE Transactions on Computers, vol.34, no. 7, pp. 680, July 1985, doi:10.1109/TC.1985.1676609
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