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Segmented Testing
May 1985 (vol. 34 no. 5)
pp. 467-471
ASCII Text
x 
 
J.P. Robinson, "Segmented Testing," IEEE Transactions on Computers, vol. 34, no. 5, pp. 467-471, May, 1985.
 
 
BibTex
x
 
@article{ 10.1109/TC.1985.1676586,
author = {J.P. Robinson},
title = {Segmented Testing},
journal ={IEEE Transactions on Computers},
volume = {34},
number = {5},
issn = {0018-9340},
year = {1985},
pages = {467-471},
doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1985.1676586},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - Segmented Testing
IS - 5
SN - 0018-9340
SP467
EP471
EPD - 467-471
A1 - J.P. Robinson,
PY - 1985
KW - testing
KW - Detection probability
KW - fault coverage
KW - fault tolerant
VL - 34
JA - IEEE Transactions on Computers
ER -
 
J.P. Robinson, Department of Electrical and Computer Engineering, University of Iowa
The fraction of faults detected for a digital network is frequently high for the first few input combinations applied out of a set of test vectors. For on-line testing, there appears to be an advantage to splitting the test into segments which are applied at different times. It is shown that the expected time to error detection and the probability of an undetected double error can be reduced. The amount of reduction is dependent on the shape of the fault coverage curve. This approach may be applicable in fault-tolerant systems.
Index Terms:
testing, Detection probability, fault coverage, fault tolerant
Citation:
J.P. Robinson, "Segmented Testing," IEEE Transactions on Computers, vol. 34, no. 5, pp. 467-471, May 1985, doi:10.1109/TC.1985.1676586
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