This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Layout Influences Testability
March 1985 (vol. 34 no. 3)
pp. 287-290
T.H. Spencer, Stanford University
This correspondence addresses actual implementation of a multiway fan-out and its effect on test generation. If a test generation ignores the fan-out implementation faults may be left undetected by the test set. Moreover, different implementations of the multiway fan-out may lead to different fault coverages. Careless implementation of the fan-out may also yield undetectable faults. Some guidelines for fan-out implementation that may enhance testability are given in this correspondence.
Index Terms:
reconvergent fan-out, Boolean difference, fan-out, layout, masking
Citation:
T.H. Spencer, J. Savir, "Layout Influences Testability," IEEE Transactions on Computers, vol. 34, no. 3, pp. 287-290, March 1985, doi:10.1109/TC.1985.1676573
Usage of this product signifies your acceptance of the Terms of Use.