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Test Pattern Generation for API Faults in RAM
March 1985 (vol. 34 no. 3)
pp. 284-287
K.K. Saluja, Department of Electrical and Computer Engineering, University of Newcastle
In this correspondence we consider the problem of test pattern generation for random-access memory to detect pattern-sensitive faults. A test algorithm is presented which contains a near-optimal WRITE sequence and is an improvement over existing algorithms. The algorithm is well suited for built-in testing applications.
Index Terms:
static pattern-sensitive faults, Built-in testing, fault detection, pattern-sensitive faults, random-access memory
Citation:
K.K. Saluja, K. Kinoshita, "Test Pattern Generation for API Faults in RAM," IEEE Transactions on Computers, vol. 34, no. 3, pp. 284-287, March 1985, doi:10.1109/TC.1985.1676572
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