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Issue No.03 - March (1985 vol.34)
pp: 284-287
K.K. Saluja , Department of Electrical and Computer Engineering, University of Newcastle
ABSTRACT
In this correspondence we consider the problem of test pattern generation for random-access memory to detect pattern-sensitive faults. A test algorithm is presented which contains a near-optimal WRITE sequence and is an improvement over existing algorithms. The algorithm is well suited for built-in testing applications.
INDEX TERMS
static pattern-sensitive faults, Built-in testing, fault detection, pattern-sensitive faults, random-access memory
CITATION
K.K. Saluja, K. Kinoshita, "Test Pattern Generation for API Faults in RAM", IEEE Transactions on Computers, vol.34, no. 3, pp. 284-287, March 1985, doi:10.1109/TC.1985.1676572
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