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C.A. Papachristou, N.B. Sahgal, "An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories," IEEE Transactions on Computers, vol. 34, no. 2, pp. 110-116, February, 1985.
 
 
BibTex
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@article{ 10.1109/TC.1985.1676547,
author = {C.A. Papachristou and N.B. Sahgal},
title = {An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories},
journal ={IEEE Transactions on Computers},
volume = {34},
number = {2},
issn = {0018-9340},
year = {1985},
pages = {110-116},
doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1985.1676547},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories
IS - 2
SN - 0018-9340
SP110
EP116
EPD - 110-116
A1 - C.A. Papachristou,
A1 - N.B. Sahgal,
PY - 1985
KW - random access memories (RAM's)
KW - Coupling faults
KW - fault models
KW - functional faults
KW - memory testing
VL - 34
JA - IEEE Transactions on Computers
ER -
 
C.A. Papachristou, Department of Computer Engineering and Science, Case Western Reserve University
This paper presents an efficient test procedure for the detection of simultaneously present functional faults in semi-conductor random access memories (RAM's). The proposed procedure detects modeled types of functional faults using 36N + 24N log2N operations, which is an improvement over existing techniques. The testing process is twofold: first, it detects simple functional faults by a
Index Terms:
random access memories (RAM's), Coupling faults, fault models, functional faults, memory testing
Citation:
C.A. Papachristou, N.B. Sahgal, "An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories," IEEE Transactions on Computers, vol. 34, no. 2, pp. 110-116, Feb. 1985, doi:10.1109/TC.1985.1676547
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