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C.A. Papachristou, Department of Computer Engineering and Science, Case Western Reserve University
This paper presents an efficient test procedure for the detection of simultaneously present functional faults in semi-conductor random access memories (RAM's). The proposed procedure detects modeled types of functional faults using 36N + 24N log2N operations, which is an improvement over existing techniques. The testing process is twofold: first, it detects simple functional faults by a
Index Terms:
random access memories (RAM's), Coupling faults, fault models, functional faults, memory testing
Citation:
C.A. Papachristou, N.B. Sahgal, "An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories," IEEE Transactions on Computers, vol. 34, no. 2, pp. 110-116, Feb. 1985, doi:10.1109/TC.1985.1676547
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