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October 1984 (vol. 33 no. 10)
pp. 947
null Kuang-Wei Chiang, Department of Electrical Engineering, University of Ottawa
This correspondence points out that the scope of application of the matrix model for MOS complex gates proposed by El-ziq and Su1does not cover general structures of this type. Also, an example is given to show that a complete detection test set for single stuck-at faults may not be able to detect all multiple faults in a fanout-free and irredundant MOS complex gate.
Index Terms:
test generation, Fault detection, MOS logic circuits
Citation:
null Kuang-Wei Chiang, Z.G. Vranesic, "Comments on "Fault Diagnosis of MOS Combinational Networks"," IEEE Transactions on Computers, vol. 33, no. 10, pp. 947, Oct. 1984, doi:10.1109/TC.1984.1676361
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