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Issue No.10 - October (1984 vol.33)
pp: 947
null Kuang-Wei Chiang , Department of Electrical Engineering, University of Ottawa
ABSTRACT
This correspondence points out that the scope of application of the matrix model for MOS complex gates proposed by El-ziq and Su<sup>1</sup>does not cover general structures of this type. Also, an example is given to show that a complete detection test set for single stuck-at faults may not be able to detect all multiple faults in a fanout-free and irredundant MOS complex gate.
INDEX TERMS
test generation, Fault detection, MOS logic circuits
CITATION
null Kuang-Wei Chiang, Z.G. Vranesic, "Comments on "Fault Diagnosis of MOS Combinational Networks"", IEEE Transactions on Computers, vol.33, no. 10, pp. 947, October 1984, doi:10.1109/TC.1984.1676361
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