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October 1984 (vol. 33 no. 10)
pp. 934-937
null Ten-Chuan Hsiao, Department of Electrical Engineering, California State University
Earlier approaches to random compact testing use a random pattern generator which depends on the combinational function under test and a circuit signature which remains the same independent of the circuit. In this correspondence we analyze the performance of a new scheme in which the pattern generator is simple and independent of the function being tested but the circuit signature is chosen to be a coefficient from the Rademacher-Walsh (RW) spectrum of the function under test. The analysis provides guidelines for choosing an RW coefficient, a test length, and an error tolerance so as to minimize the probabilities of rejecting a good unit or accepting a faulty one.
Index Terms:
random compact testing, Error analysis, functional testing, Rademacher-Walsh coefficients
null Ten-Chuan Hsiao, S.C. Seth, "An Analysis of the Use of Rademacher?Walsh Spectrum in Compact Testing," IEEE Transactions on Computers, vol. 33, no. 10, pp. 934-937, Oct. 1984, doi:10.1109/TC.1984.1676357
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