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Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults
August 1984 (vol. 33 no. 8)
pp. 758-761
Teruhiko Yamada, C&C Systems Research Laboratories, NEC Corporation, Kawasaki, 213, Japan.
Takashi Nanya, C&C Systems Research Laboratories, NEC Corporation, Kawasaki, 213, Japan.; Department of Computer Science, Tokyo Institute of Technology, Tokyo, 152, Japan.
Undetectable bridging faults between two arbitrary leads, which may produce feedback loops, in a unate two-level irredundant AND-OR network are anlyzed and their effect on stuck-at fault detection tests is explored. As a result, any complete test set for single stuck-at faults proves to still remain valid in the presence of undetectable bridging faults.
Citation:
Teruhiko Yamada, Takashi Nanya, "Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults," IEEE Transactions on Computers, vol. 33, no. 8, pp. 758-761, Aug. 1984, doi:10.1109/TC.1984.5009367
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