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Self-Testing Embedded Parity Checkers
August 1984 (vol. 33 no. 8)
pp. 753-756
Javad Khakbaz, Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science. Stanford University, Stanford, CA 94305.; Memorex Corporatio
Edward J. McCluskey, Center for Reliable Computing, Computer Systems Laboratory. Departments of Electrical Engineering and Computer Science, Stanford University, Stanford, CA 94305.
It is shown that if a 4-by-n binary matrix has four distinct even-parity rows such that each column has exactly two 0's and two 1's, then there exists a totally self-checking even-parity checker that is tested by the four rows of this matrix. The utility of this result in designing self-testing embedded parity checkers is described.
Citation:
Javad Khakbaz, Edward J. McCluskey, "Self-Testing Embedded Parity Checkers," IEEE Transactions on Computers, vol. 33, no. 8, pp. 753-756, Aug. 1984, doi:10.1109/TC.1984.5009365
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