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Built-In Testing of One-Dimensional Unilateral Iterative Arrays
June 1984 (vol. 33 no. 6)
pp. 560-564
E.M. Aboulhamid, D?partement de Math?matiques et Informatique, Universit?du Qu?bec
It has been shown in the literature that C-testable iterative arrays have very simple test structures, independent of the length of the arrays. We show in this work that all C-testable arrays are also pI-testable, which is a property yielding, in many cases, rather simple built-in-testing structures, both for the test generator and for the response verifier.
Index Terms:
test generation, Built-in testing, C-testability, iterative logic arrays, testability
Citation:
E.M. Aboulhamid, E. Cerny, "Built-In Testing of One-Dimensional Unilateral Iterative Arrays," IEEE Transactions on Computers, vol. 33, no. 6, pp. 560-564, June 1984, doi:10.1109/TC.1984.1676481
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