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| ASCII Text | x | ||
| E.J. McCluskey, "Verification Testing?A Pseudoexhaustive Test Technique," IEEE Transactions on Computers, vol. 33, no. 6, pp. 541-546, June, 1984. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1984.1676477, author = {E.J. McCluskey}, title = {Verification Testing?A Pseudoexhaustive Test Technique}, journal ={IEEE Transactions on Computers}, volume = {33}, number = {6}, issn = {0018-9340}, year = {1984}, pages = {541-546}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1984.1676477}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Verification Testing?A Pseudoexhaustive Test Technique IS - 6 SN - 0018-9340 SP541 EP546 EPD - 541-546 A1 - E.J. McCluskey, PY - 1984 KW - test pattern generation KW - Autonomous test KW - built-in self-test KW - pseudoexhaustive test VL - 33 JA - IEEE Transactions on Computers ER - | |||
A new approach to test pattern generation which is particularly suitable for self-test is described. Required computation time is much less than for present day automatic test pattern generation (ATPG) programs. Fault simulation or fault modeling is not required. More patterns may be obtained than from standard ATPG programs. However, fault coverage is much higher?all irredundant multiple as well as single stuck faults are detected. The test patterns are easily generated algorithmically either by program or hardware.
Index Terms:
test pattern generation, Autonomous test, built-in self-test, pseudoexhaustive test
Citation:
E.J. McCluskey, "Verification Testing?A Pseudoexhaustive Test Technique," IEEE Transactions on Computers, vol. 33, no. 6, pp. 541-546, June 1984, doi:10.1109/TC.1984.1676477
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