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R.K. Iyer, Science Laboratory, Department of Electrical Engineering, University of Illinois
In this correspondence models for the variation in system reliability due to uncertainty in failure rate estimation are developed. Two techniques are proposed. The first is exact and is based on the complete distribution of the failure rate. The second is an approximation and employs only the first and second moments. The application of these models in reliability analysis is then discussed and illustrated with numerical examples.
Index Terms:
Taylor approximation, Failure rate, fault-tolerant systems, mean and variance
Citation:
R.K. Iyer, "Reliability Evaluation of Fault-Tolerant Systems?Effect of Variability in Failure Rates," IEEE Transactions on Computers, vol. 33, no. 2, pp. 197-200, Feb. 1984, doi:10.1109/TC.1984.1676412
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