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| ASCII Text | x | ||
| P.K. Varshney, C.R.P. Hartmann, "Sequential Fault Diagnosis of Modular Systems," IEEE Transactions on Computers, vol. 33, no. 2, pp. 194-197, February, 1984. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1984.1676411, author = {P.K. Varshney and C.R.P. Hartmann}, title = {Sequential Fault Diagnosis of Modular Systems}, journal ={IEEE Transactions on Computers}, volume = {33}, number = {2}, issn = {0018-9340}, year = {1984}, pages = {194-197}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1984.1676411}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Sequential Fault Diagnosis of Modular Systems IS - 2 SN - 0018-9340 SP194 EP197 EPD - 194-197 A1 - P.K. Varshney, A1 - C.R.P. Hartmann, PY - 1984 KW - sequential experiments KW - Binary decision trees KW - fault diagnosis KW - fault location KW - information theory KW - permanent faults VL - 33 JA - IEEE Transactions on Computers ER - | |||
In this correspondence, we present an algorithm based on information theoretic concepts for the design of efficient sequential fault diagnosis experiments for permanent faults in modular systems.
Index Terms:
sequential experiments, Binary decision trees, fault diagnosis, fault location, information theory, permanent faults
Citation:
P.K. Varshney, C.R.P. Hartmann, "Sequential Fault Diagnosis of Modular Systems," IEEE Transactions on Computers, vol. 33, no. 2, pp. 194-197, Feb. 1984, doi:10.1109/TC.1984.1676411
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