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Random Pattern Testability
January 1984 (vol. 33 no. 1)
pp. 79-90
Jacob Savir, IBM Data Systems Division, 265/415, Poughkeepsie NY 12602; IBM T. J. Watson Research Center, Yorktown Heights, NY 10598.
Gary S. Ditlow, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598.
Paul H. Bardell, IBM Data Systems Division, 265/938, Poughkeepsie, NY 12602.
A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is therefore necessary. This paper describes a new analytical method of computing the fault coverage that is fast compared with simulation. If the fault coverage falls below a certain threshold, it is possible to identify the ``random-pattern-resistant'' faults, modify the logic to make them easy to detect, and thus, increase the fault coverage of the random test.
Citation:
Jacob Savir, Gary S. Ditlow, Paul H. Bardell, "Random Pattern Testability," IEEE Transactions on Computers, vol. 33, no. 1, pp. 79-90, Jan. 1984, doi:10.1109/TC.1984.5009315
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