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A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits
June 1983 (vol. 32 no. 6)
pp. 594-597
A.R. Virupakshia, Department of Electrical Engineering, Indian Institute of Technology
This paper suggests a method for near-optimal selection of input vector probabilities for random testing of intermittent faults in combinational circuits. The assignment of input vector probabilities is obtained by equalizing the quality factors of all test vectors in a simple way. It is shown that the degree of fault detection is comparable with that of Savir [2].
Index Terms:
random testing, Combinational circuits, intermittent fault detection
Citation:
A.R. Virupakshia, V.C.V. Pratapa Reddy, "A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits," IEEE Transactions on Computers, vol. 32, no. 6, pp. 594-597, June 1983, doi:10.1109/TC.1983.1676283
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