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Testing by Verifying Walsh Coefficients
February 1983 (vol. 32 no. 2)
pp. 198-201
| ASCII Text | x | ||
| A.K. Susskind, "Testing by Verifying Walsh Coefficients," IEEE Transactions on Computers, vol. 32, no. 2, pp. 198-201, February, 1983. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1983.1676204, author = {A.K. Susskind}, title = {Testing by Verifying Walsh Coefficients}, journal ={IEEE Transactions on Computers}, volume = {32}, number = {2}, issn = {0018-9340}, year = {1983}, pages = {198-201}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1983.1676204}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Testing by Verifying Walsh Coefficients IS - 2 SN - 0018-9340 SP198 EP201 EPD - 198-201 A1 - A.K. Susskind, PY - 1983 KW - Walsh functions KW - Exhaustive testing KW - fault detection KW - multiple fault detection KW - short testing KW - syndrome testing KW - testable design KW - testing KW - truth-table verification VL - 32 JA - IEEE Transactions on Computers ER - | |||
Testing of logic networks by verifying the Walsh coefricients of the outputs is explored. Measurement of one of these can detect arbitrarily many input leads stuck, and just two measurements, requiring little hardware, can detect any single stuck-at fault in appropriately designed networks.
Index Terms:
Walsh functions, Exhaustive testing, fault detection, multiple fault detection, short testing, syndrome testing, testable design, testing, truth-table verification
Citation:
A.K. Susskind, "Testing by Verifying Walsh Coefficients," IEEE Transactions on Computers, vol. 32, no. 2, pp. 198-201, Feb. 1983, doi:10.1109/TC.1983.1676204
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