Issue No.02 - February (1983 vol.32)
A.K. Susskind , Department of Electrical and Computer Engineering, Lehigh University
Testing of logic networks by verifying the Walsh coefricients of the outputs is explored. Measurement of one of these can detect arbitrarily many input leads stuck, and just two measurements, requiring little hardware, can detect any single stuck-at fault in appropriately designed networks.
Walsh functions, Exhaustive testing, fault detection, multiple fault detection, short testing, syndrome testing, testable design, testing, truth-table verification
A.K. Susskind, "Testing by Verifying Walsh Coefficients", IEEE Transactions on Computers, vol.32, no. 2, pp. 198-201, February 1983, doi:10.1109/TC.1983.1676204