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Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect?Cause Analysis
December 1982 (vol. 31 no. 12)
pp. 1165-1172
M. Abramovici, Bell Laboratories
In this paper we present a new approach to fault diagnosis in sequential circuits based on an effect?cause analysis. This represents an extension of our previous work dealing with combinational circuits [1]. The main tool of our approach is the Deduction Algorithm, which deduces internal values in the circuit under test based upon the test results. The deduced values are used for fault diagnosis, which encompasses both fault detection and location.
Index Terms:
single and multiple stuck faults, Circuit initialization, effect?cause analysis, fault diagnosis, functional and structural equivalence relations, sequential circuits
Citation:
M. Abramovici, M.A. Breuer, "Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect?Cause Analysis," IEEE Transactions on Computers, vol. 31, no. 12, pp. 1165-1172, Dec. 1982, doi:10.1109/TC.1982.1675940
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