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Issue No.07 - July (vol.31)
ISSN: 0018-9340
TABLE OF CONTENTS
Papers
null Se June Hong , IBM T. J. Watson Research Center
pp. 575-577
J.H. Patel , Coordinated Science Laboratory, and the Department of Electrical Engineering, University of Illinois
pp. 589-595
S. Kaneda , Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
pp. 596-602
D.J. Taylor , Department of Computer Science, University of Waterloo
pp. 602-608
H. Rudin , IBM Zurich Research Laboratory
pp. 630-636
J.-M. Ayache , Laboratoire d'Automatique et d'Analyse des Systemes, C.N.R.S.
pp. 637-647
J.F. Meyer , Departments of Electrical and Computer Engineering and Computer and Communication Sciences, University of Michigan
pp. 648-657
J. Khakbaz , Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford. University
pp. 677-681
D.J. Lu , Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
pp. 681-685
A. Mili , Department of Computer and Information Sciences, Texas A & M University
pp. 685-689
R.E. Glaser , Department of Electrical Engineering and Computer Science, The G.W.C. Whiting School of Engineering, The Johns Hopkins University
pp. 689-692
S.K. Shrivastava , Computing Laboratory, University of Newcastle upon Tyne
pp. 692-697
R.K. Iyer , Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
pp. 697-706
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