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The Reliability of Memory with Single-Error Correction
June 1982 (vol. 31 no. 6)
pp. 560-564
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.
Index Terms:
single-error correction, Error-correcting codes, fault-tolerant systems, memory reliability, semiconductior memory
Citation:
W.F. Mikhail, R.W. Bartoldus, R.A. Rutledge, "The Reliability of Memory with Single-Error Correction," IEEE Transactions on Computers, vol. 31, no. 6, pp. 560-564, June 1982, doi:10.1109/TC.1982.1676042
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