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The Reliability of Memory with Single-Error Correction
June 1982 (vol. 31 no. 6)
pp. 560-564
| ASCII Text | x | ||
| W.F. Mikhail, R.W. Bartoldus, R.A. Rutledge, "The Reliability of Memory with Single-Error Correction," IEEE Transactions on Computers, vol. 31, no. 6, pp. 560-564, June, 1982. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1982.1676042, author = {W.F. Mikhail and R.W. Bartoldus and R.A. Rutledge}, title = {The Reliability of Memory with Single-Error Correction}, journal ={IEEE Transactions on Computers}, volume = {31}, number = {6}, issn = {0018-9340}, year = {1982}, pages = {560-564}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1982.1676042}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - The Reliability of Memory with Single-Error Correction IS - 6 SN - 0018-9340 SP560 EP564 EPD - 560-564 A1 - W.F. Mikhail, A1 - R.W. Bartoldus, A1 - R.A. Rutledge, PY - 1982 KW - single-error correction KW - Error-correcting codes KW - fault-tolerant systems KW - memory reliability KW - semiconductior memory VL - 31 JA - IEEE Transactions on Computers ER - | |||
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.
Index Terms:
single-error correction, Error-correcting codes, fault-tolerant systems, memory reliability, semiconductior memory
Citation:
W.F. Mikhail, R.W. Bartoldus, R.A. Rutledge, "The Reliability of Memory with Single-Error Correction," IEEE Transactions on Computers, vol. 31, no. 6, pp. 560-564, June 1982, doi:10.1109/TC.1982.1676042
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