Issue No.06 - June (1982 vol.31)
W.F. Mikhail , IBM Corporation
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.
single-error correction, Error-correcting codes, fault-tolerant systems, memory reliability, semiconductior memory
W.F. Mikhail, R.W. Bartoldus, R.A. Rutledge, "The Reliability of Memory with Single-Error Correction", IEEE Transactions on Computers, vol.31, no. 6, pp. 560-564, June 1982, doi:10.1109/TC.1982.1676042