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The Weighted Syndrome Sums Approach to VLSI Testing
December 1981 (vol. 30 no. 12)
pp. 996-1000
Z. Barzilai, IBM Thomas J. Watson Research Center
With the advent of VLSI, testing has become one of the most costly, complicated, and time consuming problems. The method of syndrome- testing is applicable toward VLSI testing since it does not require test generation and fault simulation. It can also be considered as a vehicle for self-testing. In order to employ syndrome-testing in VLSI, we electronically partition the chip into macros in test mode. The macros are then syndrome tested in sequence.
Index Terms:
Syndrome-testing, Partitioning, self-testing, syndrome-testable design
Citation:
Z. Barzilai, J. Savir, G. Markowsky, M.G. Smith, "The Weighted Syndrome Sums Approach to VLSI Testing," IEEE Transactions on Computers, vol. 30, no. 12, pp. 996-1000, Dec. 1981, doi:10.1109/TC.1981.1675744
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