The Weighted Syndrome Sums Approach to VLSI Testing

Z. Barzilai; M.G. Smith; J. Savir; G. Markowsky

doi:10.1109/TC.1981.1675744

Publication
1981
Issue No. 12 - December
Abstract - The Weighted Syndrome Sums Approach to VLSI Testing

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The Weighted Syndrome Sums Approach to VLSI Testing

December 1981 (vol. 30 no. 12)

pp. 996-1000

	ASCII Text	x
	Z. Barzilai, J. Savir, G. Markowsky, M.G. Smith, "The Weighted Syndrome Sums Approach to VLSI Testing," IEEE Transactions on Computers, vol. 30, no. 12, pp. 996-1000, December, 1981.

	BibTex	x
	@article{ 10.1109/TC.1981.1675744, author = {Z. Barzilai and J. Savir and G. Markowsky and M.G. Smith}, title = {The Weighted Syndrome Sums Approach to VLSI Testing}, journal ={IEEE Transactions on Computers}, volume = {30}, number = {12}, issn = {0018-9340}, year = {1981}, pages = {996-1000}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1981.1675744}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - JOUR JO - IEEE Transactions on Computers TI - The Weighted Syndrome Sums Approach to VLSI Testing IS - 12 SN - 0018-9340 SP996 EP1000 EPD - 996-1000 A1 - Z. Barzilai, A1 - J. Savir, A1 - G. Markowsky, A1 - M.G. Smith, PY - 1981 KW - Syndrome-testing KW - Partitioning KW - self-testing KW - syndrome-testable design VL - 30 JA - IEEE Transactions on Computers ER -

Z. Barzilai, IBM Thomas J. Watson Research Center

J. Savir

G. Markowsky

M.G. Smith

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.1981.1675744

With the advent of VLSI, testing has become one of the most costly, complicated, and time consuming problems. The method of syndrome- testing is applicable toward VLSI testing since it does not require test generation and fault simulation. It can also be considered as a vehicle for self-testing. In order to employ syndrome-testing in VLSI, we electronically partition the chip into macros in test mode. The macros are then syndrome tested in sequence.

Index Terms:

Syndrome-testing, Partitioning, self-testing, syndrome-testable design

Citation:

Z. Barzilai, J. Savir, G. Markowsky, M.G. Smith, "The Weighted Syndrome Sums Approach to VLSI Testing," IEEE Transactions on Computers, vol. 30, no. 12, pp. 996-1000, Dec. 1981, doi:10.1109/TC.1981.1675744

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