The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.12 - December (1981 vol.30)
pp: 989-995
null Chi-Chang Liaw , Research Group on Design Automation and Fault-Tolerant Computing, School of Advanced Technology, State University of New York
ABSTRACT
Practical solutions have not been obtained from the previous papers addressing the problem of testing intermittent faults in sequential circuits. Existing methods are only suitable for small sequential circuits. This correspondence presents a new technique to design test-experiments for intermittent faults which can conveniently be used for relatively more complex synchronous sequential circuits.
INDEX TERMS
transient faults, Dynamic programming, fault detection, fault diagnosis, fault location, integer programming, intermittent faults, ordering of test sequences, repetitive testing, sequential circuits, simulation, test experiments
CITATION
null Chi-Chang Liaw, S.Y.H. Su, Y.K. Malaiya, "Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits", IEEE Transactions on Computers, vol.30, no. 12, pp. 989-995, December 1981, doi:10.1109/TC.1981.1675743
286 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool