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December 1981 (vol. 30 no. 12)
pp. 989-995
| ASCII Text | x | ||
| null Chi-Chang Liaw, S.Y.H. Su, Y.K. Malaiya, "Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits," IEEE Transactions on Computers, vol. 30, no. 12, pp. 989-995, December, 1981. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1981.1675743, author = {null Chi-Chang Liaw and S.Y.H. Su and Y.K. Malaiya}, title = {Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits}, journal ={IEEE Transactions on Computers}, volume = {30}, number = {12}, issn = {0018-9340}, year = {1981}, pages = {989-995}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1981.1675743}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits IS - 12 SN - 0018-9340 SP989 EP995 EPD - 989-995 A1 - null Chi-Chang Liaw, A1 - S.Y.H. Su, A1 - Y.K. Malaiya, PY - 1981 KW - transient faults KW - Dynamic programming KW - fault detection KW - fault diagnosis KW - fault location KW - integer programming KW - intermittent faults KW - ordering of test sequences KW - repetitive testing KW - sequential circuits KW - simulation KW - test experiments VL - 30 JA - IEEE Transactions on Computers ER - | |||
Practical solutions have not been obtained from the previous papers addressing the problem of testing intermittent faults in sequential circuits. Existing methods are only suitable for small sequential circuits. This correspondence presents a new technique to design test-experiments for intermittent faults which can conveniently be used for relatively more complex synchronous sequential circuits.
Index Terms:
transient faults, Dynamic programming, fault detection, fault diagnosis, fault location, integer programming, intermittent faults, ordering of test sequences, repetitive testing, sequential circuits, simulation, test experiments
Citation:
null Chi-Chang Liaw, S.Y.H. Su, Y.K. Malaiya, "Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits," IEEE Transactions on Computers, vol. 30, no. 12, pp. 989-995, Dec. 1981, doi:10.1109/TC.1981.1675743
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