Issue No.12 - December (1981 vol.30)
T.W. Williams , General Technology Division, IBM
This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage with some assumptions. It is assumed that the faults occur randomly on the chips, which implies no clustering. This concept is extended to modules on boards.
yield, Fault coverage, stuck-at-fault, testing
T.W. Williams, "Defect Level as a Function of Fault Coverage", IEEE Transactions on Computers, vol.30, no. 12, pp. 987-988, December 1981, doi:10.1109/TC.1981.1675742