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Defect Level as a Function of Fault Coverage
December 1981 (vol. 30 no. 12)
pp. 987-988
T.W. Williams, General Technology Division, IBM
This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage with some assumptions. It is assumed that the faults occur randomly on the chips, which implies no clustering. This concept is extended to modules on boards.
Index Terms:
yield, Fault coverage, stuck-at-fault, testing
Citation:
T.W. Williams, N.C. Brown, "Defect Level as a Function of Fault Coverage," IEEE Transactions on Computers, vol. 30, no. 12, pp. 987-988, Dec. 1981, doi:10.1109/TC.1981.1675742
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